Casting Point – SIMET - Scanning electron microscope (SEM) and energy dispersive spectrometer (EDX)

Scanning electron microscope (SEM) and energy dispersive spectrometer (EDX)

Manufacturer and type:	TESCAN VEGA 5136MM
Purpose:	The scanning electron microscope is used for observing of microstructure / fracture surfaces of metal and non-metallic materials and determining the chemical composition of the selected positions (point analysis, line analysis, mapping analysis).
Kratki opis metode:	The scanning electron microscope is a type of electron microscope which is used for observations at high magnifications and is based on scanning a sample surface with a focused electron beam.
Tehničke značajke:	220-240V/50Hz
Tip i priprava uzorka:	Enables samples observation with/without previous metallographic preparation.
Laboratory:	Laboratory of Physics and structural testing
Operater:	Franjo Kozina, mag.ing.met. T: 533 378 E: fkozin@simet.hr Ivana Ivanić, PhD T: +385 44 533 378 E: ivanic@simet.hr Assoc. Prof. Ljerka Slokar, PhD T: +385 44 533 378 E: slokar@simet.hr Assoc. Prof. Stjepan Kožuh, PhD T: +385 44 533 379 E: kozuh@simet.hr Tomislav Rupčid, mag.ing.met. T: +385 44 533 378 E: trupcic@simet.hr Assoc. Prof. Zdenka Zovko Brodarac, PhD T: +385 44 533 379 E: zovko@simet.hr

Previous apparatus Next apparatus